HARPIA-TG
Transient Grating Spectrometer designed for measuring carrier diffusion and carrier lifetime using laser-induced transient grating (LITG) spectroscopy.
-Measures carrier diffusion coefficient within minutes -Fully automated and computer-controlled system -Non-invasive all-optical measurement technique -High sensitivity down to µJ/cm² excitation level -Continuous control of transient grating period -Optional photoluminescence (PL) measurement -Compatible with femtosecond laser systems such as PHAROS or CARBIDE
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Description
HARPIA-TG is a transient grating spectroscopy system designed to measure carrier diffusion coefficients, diffusion lengths, and carrier lifetimes in semiconductor and nanomaterials. The system is based on the laser-induced transient grating (LITG) technique, where two ultrashort pump pulses interfere at the sample surface, creating a spatial interference pattern. This pattern forms a transient grating in the material that modulates the refractive index. A delayed probe pulse is then diffracted by this transient grating, allowing researchers to analyze the temporal decay of the signal to determine diffusion dynamics and recombination processes in the material.
Specifications
Measurement modes : Transmission / Reflection Grating recording wavelength : 340 – 560 nm Probe wavelength : 1030 nm Grating period : ~1.05 – 12.5 µm (ขึ้นกับ pump wavelength) Pulse duration : < 290 fs Delay range : Up to 8 ns Diffusion coefficient range : ≥ 0.1 cm²/s Carrier lifetime range : ~3 ps – 8 ns System dimensions : ~730 × 420 × 188 mm
Application
HARPIA-TG is widely used in semiconductor and materials research, including : Carrier diffusion measurement Carrier lifetime measurement Carrier diffusion length determination Single-wavelength absorption studies Typical materials studied include : Silicon carbide (SiC) Gallium nitride (GaN) Perovskites Organic and inorganic solar cells Quantum dots Quantum wells and nanostructures