CLS
Clock laser system
Quantity
Key Highlights
- 206–1770 nm wavelength range*
- <1 Hz linewidth
- Frequency stability <2 × 10⁻¹⁵
- High-finesse ULE cavity stabilization
- Excellent vibration and temperature stability
- Available with frequency conversion and amplification
- Industrial-grade design with optional 19" rack integration
Description
Industrial-grade ultra-stable lasers with low phase noise enable advanced quantum technologies that rely on narrow-linewidth clock transitions and therefore require laser systems with sub-Hz linewidth and high stability even in out-of-the-lab conditions. TOPTICA’s ultra-stable “CLS” lasers yield the highest frequency stability far beyond 1-second integration time to drive very narrow optical transitions in atoms like Yb, Sr, or ions like Yb+, Sr+, Ca+, and Ba+, or even in Th nuclei.
TOPTICA's CLS usually uses external cavity diode lasers whose linewidth is reduced to less than 1 Hz via frequency stabilization to high-finesse optical ULE cavities. For wavelengths below ~ 660 nm, the fundamental laser at a higher wavelength is first stabilized in the ULE cavity and then frequency converted (SHG/FHG). Amplification is possible via ALS-IR low-noise fiber amplifiers or TA pro tapered amplifiers. Robust design, excellent passive shielding, and active vibration compensation make the CLS resilient to external acoustic and seismic vibrations. A high-end temperature stabilization system guarantees the highest stability against temperature fluctuations. The complete system is controlled with one DLC Pro-hosted interface and can be accessed with the PC GUI TOPAS.
Specifications
Laser Type: Ultra-Stable Clock Laser System
Wavelength: 206–1770 nm*
Linewidth: <1 Hz
Frequency Stability: <2 × 10⁻¹⁵
Linear Drift: <150 mHz/s
Cavity Finesse: >200,000
Free Spectral Range: 1.5 GHz
Control: DLC pro / TOPAS
*Including frequency-conversion systems upon request.
Application
- Optical Quantum Clocks
- Quantum Computing & Simulation
- Ion & Atom Trapping
- Precision Spectroscopy
- Quantum Physics
- Sensing & Metrology


