Delays, Gates & Logic Modules

Essential modules for signal timing alignment and event selection in radiation systems
Enables precise coincidence, anticoincidence, and gating operations
Wide range of instruments including:

• Delay modules
• Gate and delay generators
• Logic units
• Linear gates

Nanosecond to microsecond timing control for high-precision experiments
Supports coincidence measurements and event validation (go/no-go logic)
Multi-channel solutions available for complex experimental setups
Compatible with MCA, SCA, amplifiers, and detector systems
NIM-standard modules for flexible laboratory integration

Delays and Gates are critical electronic instruments used in radiation detection and nuclear physics systems to control the timing and selection of detector signals.

In complex experiments, signals often arrive from multiple detectors or processing paths at different times. Delay modules are used to align these signals so they reach a common decision point simultaneously. This synchronization is essential for accurate coincidence measurements and signal correlation.

Gate and delay generators allow users to define when signals are accepted or rejected by generating timing windows (gates) with adjustable delay and width. This ensures that only relevant events are processed by downstream instruments such as multichannel analyzers (MCA).

Logic modules combine signals from multiple sources to perform logical operations (e.g., AND, OR, coincidence), enabling advanced event selection in nuclear experiments.

Linear gates are used to selectively pass or block analog signals based on timing conditions, ensuring that only valid signals are analyzed.

ORTEC offers a comprehensive portfolio of delay and gate modules such as 414A Fast Coincidence, 416A Gate and Delay Generator, 418A Universal Coincidence, 425A Nanosecond Delay, and 542 Linear Gate, providing flexible solutions for both research and applied radiation measurement systems.

Product Type: Delay, Gate, Logic Module, Linear Gate (NIM standard)
Functions:

• Signal delay (time alignment)
• Gate generation (timing window control)
• Logical signal processing (coincidence/anticoincidence)
• Analog signal gating

Delay Range: Nanoseconds to microseconds (e.g., ~0.1 µs to 110 µs typical)
Pulse Width Control: Adjustable output pulse width (e.g., ~400 ns to several µs)
Timing Resolution: High precision with low jitter (nanosecond-level stability)
Input/Output:

• NIM-standard logic signals
• TTL compatibility (model dependent)

Channel Options:

• Single-channel modules
• Multi-channel systems (e.g., octal gate generators)

Key Features:

• Adjustable delay and gate width
• Coincidence/anticoincidence logic
• Fast logic signal processing
• High timing stability

Form Factor: NIM modular electronics (laboratory standard)

• Coincidence and anticoincidence measurements
• Time-of-flight (TOF) experiments
• Nuclear and particle physics research
• Gamma and alpha spectroscopy systems
• Signal synchronization in multi-detector setups
• Event selection and background rejection
• Accelerator-based experiments
• Active shielding systems